Configurable, fully self-developed wafer-level test systems for STT / SOT / VCMA-MRAM.
China's first home-grown 12-inch MRAM wafer-level high-speed test system — from manual operation to unattended, integrating high-precision magnetic control, picosecond pulse test and AI-assisted analytics.
Learn more →Configurable architecture for STT / SOT / VCMA-MRAM, extracting toggle write, thermal stability, read/write disturb and endurance characteristics.
Learn more →Arrhenius-based acceleration algorithm compresses months of reliability validation into weeks, combined with high-sensitivity domain imaging and electrical failure analysis.
Learn more →| Dimension | Industry Pain Point | Jishunxin |
|---|---|---|
| Throughput | Long single-die test time, capacity bottleneck | Parallel multi-site, +300% throughput |
| Field precision | Poor external field uniformity, edge effects | Built-in 3D Helmholtz coil, <0.5% uniformity |
| Data value | Low utilization of massive test data | Real-time yield & process correlation engine |
| Supply chain | 100% import dependency on core tools | Fully self-reliant, secure supply chain |
From R&D validation to mass-production monitoring, we co-develop dedicated test solutions for your devices.
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